Equipment topics


Environmentally Controlled Three-Dimensional Nano-Structure Analyzer System
Installation : 
March 2002
Description : 
Electron Probe Three-Dimensional Surface Roughness Analyzer Magnification : x300000, Resolution : 3.5 nm (Z-Axis 1.0 nm)
Contact : 
           



 
Copyright© Joining and Welding Research Institute Osaka Uni versity. All Rights Reserved.