Equipment topics

3D Microstructure Analysis System
Installation : 
September 2013
Description : 
Hitachi High-Technologies NB5000 (FIB/FE-SEM) equipped with TSL EBSD analysis system. Cross-sectional FE-SEM/EBSD images can be obtained, leading to 3D-SEM/EBSD images can be created using the attached software (Our support is essential).  
Contact : 

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